SEMICONDUCTOR PARAMETER METERS ИППП-1
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- 4-channel automated system for semiconductor parameter measurements (inclusive of test structures on wafers)
- Measurement of voltage-current characteristics of two-, three-, and four-terminal networks
- Parameters of each channel Source/meter:- U: ±2 V, ±30 V (200 mА), ±120 V (±10 mА), I: ±20, ±200 nА, ±2, ±20, ±200 μА, ±2, ±10mА, (±120V), ±20, ±200 mА ( ±30V)
- Accuracy of source and meter U, I ±0.5%
- Meter sensitivity U/I: 10 μV/0.1 pA
- Plots, tables, texts, databases
- RS-232C, software for computer
- Dimensions, weight: 450x266x444 mm, 23 kg
- Power: 220 VAC, 120 VА